Scanning Electron Microscopy

Is a microscopy technique which uses a beam of electrons to form an image, the electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

Solid conductive (metals) and non conductive (minerals, polymers, ceramics, fabrics and organic) samples can be tested as they are free of moisture.

Image Capture and Search for Defects and Microscopic Details

Semiquantitative Elemental Composition Analysis and Elemental Concentration Profile

Analysis and Comparison of Microstructures of Fe-C Alloys

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